![](/img/cover-not-exists.png)
[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Impact of All-Digital PLL on SoC Testing
Nakura, Toru, Iizuka, Tetsuya, Asada, KunihiroYear:
2012
Language:
english
DOI:
10.1109/ATS.2012.22
File:
PDF, 217 KB
english, 2012