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[IEEE 2014 IEEE Faible Tension Faible Consommation (FTFC) - Monaco, Monaco (2014.5.4-2014.5.6)] 2014 IEEE Faible Tension Faible Consommation - A 0.28-0.8V 320 fW D-latch for sub-VT memories in 65 nm CMOS
Mohammadi, Babak, Andersson, Oskar, Meinerzhagen, Pascal, Sherazi, Yasser, Burg, Andreas, Rodrigues, Joachim NevesYear:
2014
Language:
english
DOI:
10.1109/ftfc.2014.6828618
File:
PDF, 2.23 MB
english, 2014