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Synchrotron radiation x-ray topography and defect selective etching analysis of threading dislocations in GaN
Sintonen, Sakari, Rudziński, Mariusz, Suihkonen, Sami, Jussila, Henri, Knetzger, Michael, Meissner, Elke, Danilewsky, Andreas, Tuomi, Turkka O., Lipsanen, HarriVolume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4893901
Date:
August, 2014
File:
PDF, 1.65 MB
english, 2014