![](/img/cover-not-exists.png)
[IEEE 2010 International Conference on Advanced Optoelectronics and Lasers (CAOL) - Sevastopol, Ukraine (2010.09.10-2010.09.14)] 2010 International Conference on Advanced Optoelectronics and Lasers - Measuring surface distribution of narrowband radiation wavelength by colorimetric method
Kraiski, A.V., Mironova, T.V., Sultanov, T.T., Postnikov, V.A.Year:
2010
Language:
english
DOI:
10.1109/caol.2010.5634214
File:
PDF, 389 KB
english, 2010