A built-in self-repair design for RAMs with 2-D redundancy

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2005 / 06 Vol. 13; Iss. 6

A built-in self-repair design for RAMs with 2-D redundancy

Jin-Fu Li,, Yeh, J.-C., Rei-Fu Huang,, Cheng-Wen Wu,
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2005.848824
Date:
June, 2005
File:
PDF, 403 KB
english, 2005
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