Full field and microregion deformation measurement of thin...

Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method

Xide Li, Cheng Wei, Yan Yang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Year:
2005
Language:
english
Pages:
16
DOI:
10.1016/j.optlaseng.2004.09.004
File:
PDF, 713 KB
english, 2005
Conversion to is in progress
Conversion to is failed