Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method
Xide Li, Cheng Wei, Yan YangVolume:
43
Year:
2005
Language:
english
Pages:
16
DOI:
10.1016/j.optlaseng.2004.09.004
File:
PDF, 713 KB
english, 2005