An application of Raman spectroscopy on the measurement of...

An application of Raman spectroscopy on the measurement of residual stress in porous silicon

Yilan Kang, Yu Qiu, Zhenkun Lei, Ming Hu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Year:
2005
Language:
english
Pages:
9
DOI:
10.1016/j.optlaseng.2004.09.005
File:
PDF, 336 KB
english, 2005
Conversion to is in progress
Conversion to is failed