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An application of Raman spectroscopy on the measurement of residual stress in porous silicon
Yilan Kang, Yu Qiu, Zhenkun Lei, Ming HuVolume:
43
Year:
2005
Language:
english
Pages:
9
DOI:
10.1016/j.optlaseng.2004.09.005
File:
PDF, 336 KB
english, 2005