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[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Field acceleration for oxide breakdown-can an accurate anode hole injection model resolve the E vs. 1/E controversy?
Alam, M.A., Bude, J., Ghetti, A.Year:
2000
Language:
english
DOI:
10.1109/relphy.2000.843886
File:
PDF, 565 KB
english, 2000