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[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - Modeling device manufacturing uncertainty in Electromagnetic Simulations
de Menezes, Leonardo R.A.X., Paredes, Abraham O., Abdalla, Humberto, Borges, Geovany A.Year:
2008
Language:
english
DOI:
10.1109/mwsym.2008.4633036
File:
PDF, 368 KB
english, 2008