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[IEEE 2006 International Conference on Microelectronics - Dhahran, Saudi Arabia (2006.12.16-2006.12.19)] 2006 International Conference on Microelectronics - Improved Assertion Lifetime via Assertion-Based Testing Methodology
Riazati, Mohammad, Mohammadi, Siamak, Afzali-Kusha, Ali, Navabi, ZainYear:
2006
Language:
english
DOI:
10.1109/icm.2006.373264
File:
PDF, 1.40 MB
english, 2006