Single-Event Charge Collection and Upset in 40-nm Dual- and...

Single-Event Charge Collection and Upset in 40-nm Dual- and Triple-Well Bulk CMOS SRAMs

Chatterjee, Indranil, Narasimham, Balaji, Mahatme, Nihaar N., Bhuva, Bharat L., Schrimpf, Ronald D., Wang, Jung K., Bartz, Bartz, Pitta, Eswara, Buer, Myron
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2172817
Date:
December, 2011
File:
PDF, 1.09 MB
english, 2011
Conversion to is in progress
Conversion to is failed