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[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Substrate effects on metal-oxide single electron transistors electrometer measurements.
George, Hubert C., Orlov, Alexei O., Snider, Gregory L.Year:
2010
Language:
english
DOI:
10.1109/drc.2010.5551860
File:
PDF, 660 KB
english, 2010