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[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Matched test structures for accurate characterization in millimeter wave range
Hamani, Rachid, Andrei, Cristian, Jarry, Bernard, Lintignat, JulienYear:
2014
Language:
english
DOI:
10.1109/icmts.2014.6841483
File:
PDF, 1.58 MB
english, 2014