Performance and breakdown behavior of graphene field-effect transistors with thin gate oxides
Wang, Quan, Liu, Shuai, Zhang, Jin, Zhu, Jun, Ge, Daohan, Ren, NaifeiVolume:
24
Language:
english
Journal:
Journal of Micromechanics and Microengineering
DOI:
10.1088/0960-1317/24/4/045016
Date:
April, 2014
File:
PDF, 1.36 MB
english, 2014