[IEEE LEOS '93 - San Jose, CA, USA (15-18 Nov. 1993)] Proceedings of LEOS '93 - Recent progress in semiconductor laser reliability and failure analysis
DeChiaro, L.F., Ovadia, S., Sandroff, C.J., Schiavone, L.M.Year:
1993
Language:
english
DOI:
10.1109/leos.1993.379269
File:
PDF, 226 KB
english, 1993