![](/img/cover-not-exists.png)
[IEEE ICT2001. 20 International Conference on Thermoelectrics - Beijing, China (8-11 June 2001)] Proceedings ICT2001. 20 International Conference on Thermoelectrics (Cat. No.01TH8589) - Strain imaging in thermoelectric devices by laser probe shearography
Jorez, S., Dilhaire, S., Lopez, L.P., Granby, S., Claeys, W., Uemura, K., Stockholm, J.G.Year:
2001
Language:
english
DOI:
10.1109/ict.2001.979941
File:
PDF, 496 KB
english, 2001