[IEEE 2014 15th International Conference on Ultimate...

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[IEEE 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - Stockholm, Sweden (2014.04.7-2014.04.9)] 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications

Makovejev, S., Esfeh, B. Kazemi, Barral, V., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., Kilchytska, V.
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Year:
2014
Language:
english
DOI:
10.1109/ulis.2014.6813904
File:
PDF, 1.37 MB
english, 2014
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