[IEEE Eleventh IEEE European Test Symposium (ETS'06) -...

  • Main
  • [IEEE Eleventh IEEE European Test...

[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults

Devtaprasanna, N., Gunda, A., Krishnamurthy, P., Reddy, S.M., Pomeranz, I.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/ets.2006.8
File:
PDF, 240 KB
english, 2006
Conversion to is in progress
Conversion to is failed