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[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults
Devtaprasanna, N., Gunda, A., Krishnamurthy, P., Reddy, S.M., Pomeranz, I.Year:
2006
Language:
english
DOI:
10.1109/ets.2006.8
File:
PDF, 240 KB
english, 2006