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[IEEE 2010 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Chengdu, China (2010.05.8-2010.05.11)] 2010 International Conference on Microwave and Millimeter Wave Technology - An efficiency measurement method for total isotropic sensitivity based on data predication

Honglong, Cao, Huiping, Guo, Li, Zhang, Xueguan, Liu
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Year:
2010
Language:
english
DOI:
10.1109/icmmt.2010.5525154
File:
PDF, 102 KB
english, 2010
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