[IEEE 2010 IEEE 8th International Symposium on Applied...

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[IEEE 2010 IEEE 8th International Symposium on Applied Machine Intelligence and Informatics (SAMI 2010) - Herlany (2010.01.28-2010.01.30)] 2010 IEEE 8th International Symposium on Applied Machine Intelligence and Informatics (SAMI) - Composition and categorization of aspect-oriented design patterns

Menkyna, R., Vranic, V., Polasek, I.
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Year:
2010
Language:
english
DOI:
10.1109/sami.2010.5423751
File:
PDF, 511 KB
english, 2010
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