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TEM investigation of Tm implanted GaN, the influence of high temperature annealing
T. Wójtowicz, F. Gloux, P. Ruterana, K. Lorenz, E. AlvesVolume:
28
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.optmat.2005.09.012
File:
PDF, 346 KB
english, 2006