[IEEE 2011 International Symposium on VLSI Design,...

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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - High performance DDR architecture in Intel® Core™ processors using 32nm CMOS high-K metal-gate process

Mosalikanti, Praveen, Mozak, Chris, Kurd, Nasser
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Year:
2011
Language:
english
DOI:
10.1109/vdat.2011.5783599
File:
PDF, 509 KB
english, 2011
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