[IEEE 2006 IEEE International Test Conference - Santa...

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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - OCI: Open Compression Interface

Cory, Bruce, Kapur, Rohit, Tegethoff, Mick, Kassab, Mark, Keller, Brion, Kim, Kee, Burek, Dwayne, Oakland, Steve, Nadeau-Dostie, Benoit
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Year:
2006
Language:
english
DOI:
10.1109/test.2006.297746
File:
PDF, 91 KB
english, 2006
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