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[IEEE 21st IEEE/ACM International Conference on Automated Software Engineering (ASE'06) - Tokyo (2006.09.18-2006.09.22)] 21st IEEE/ACM International Conference on Automated Software Engineering (ASE'06) - A methodology for automated test generation guided by functional coverage constraints at specification level
Laurent, Odile, Seguin, Christel, Wiels, VirginieYear:
2006
Language:
english
DOI:
10.1109/ase.2006.6
File:
PDF, 94 KB
english, 2006