[IEEE 2010 IEEE International Electron Devices Meeting...

  • Main
  • [IEEE 2010 IEEE International Electron...

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - PBTI mechanisms in La containing Hf-based oxides assessed by very Fast IV measurements

Garros, X., Brunet, L., Rafik, M., Coignus, J., Reimbold, G, Vincent, E., Bravaix, A., Boulanger, F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/iedm.2010.5703297
File:
PDF, 396 KB
english, 2010
Conversion to is in progress
Conversion to is failed