AlGaN/GaN HFET reliability

IEEE Microwave Magazine 2009 / 06 Vol. 10; Iss. 4

AlGaN/GaN HFET reliability

Trew, Robert, Green, Daniel, Shealy, Jeffrey
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Volume:
10
Language:
english
Journal:
IEEE Microwave Magazine
DOI:
10.1109/mmm.2009.932286
Date:
June, 2009
File:
PDF, 4.23 MB
english, 2009
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