Electron traps on high-temperature oxidized SIMOX buried...

IEEE Electron Device Letters 1996 / 07 Vol. 17; Iss. 7

Electron traps on high-temperature oxidized SIMOX buried oxides

Lawrence, R.K., Ioannou, D.E.
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Volume:
17
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.506361
Date:
July, 1996
File:
PDF, 265 KB
english, 1996
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