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[IEEE 1997 IEEE International Symposium on Electronics and the Environment. ISEE-1997 - San Francisco, CA, USA (5-7 May 1997)] Proceedings of the 1997 IEEE International Symposium on Electronics and the Environment. ISEE-1997 - Knowledge based system for faulty components detection in production testing of electronic device
Bajovic, V., Bojkovic, G., Kovacevic, V.Year:
1997
Language:
english
DOI:
10.1109/isee.1997.605333
File:
PDF, 374 KB
english, 1997