[IEEE 2009 IEEE Symposium on Visual Analytics Science and Technology - Atlantic City, NJ, USA (2009.10.12-2009.10.13)] 2009 IEEE Symposium on Visual Analytics Science and Technology - Iterative integration of visual insights during patent search and analysis
Koch, Steffen, Bosch, Harald, Giereth, Mark, Ertl, ThomasYear:
2009
Language:
english
DOI:
10.1109/vast.2009.5333564
File:
PDF, 1.37 MB
english, 2009