[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - On static test compaction and test pattern ordering for scan designs
Xijiang Lin,, Rajski, J., Pomeranz, I., Reddy, S.M.Year:
2001
Language:
english
DOI:
10.1109/test.2001.966735
File:
PDF, 1.00 MB
english, 2001