[IEEE International Test Conference - Baltimore, MD, USA...

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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - On static test compaction and test pattern ordering for scan designs

Xijiang Lin,, Rajski, J., Pomeranz, I., Reddy, S.M.
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Year:
2001
Language:
english
DOI:
10.1109/test.2001.966735
File:
PDF, 1.00 MB
english, 2001
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