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[IEEE 1993 (5th) International Conference on Indium Phosphide and Related Materials - Paris, France (19-22 April 1993)] 1993 (5th) International Conference on Indium Phosphide and Related Materials - Correlation between interfacial defects and electrical properties of LP-MOCVD GaInAs/InP heterostructures, application to high performance 1.67 μm GaInAs/InP PiN photodiodes
di Forte-Poisson, M.A., Brylinski, C., Herbeaux, C., Androussi, Y., Lefebvre, A., di Persio, J., Vassilakis, E., Herrbach, F., Carriere, C.Year:
1993
Language:
english
DOI:
10.1109/iciprm.1993.380692
File:
PDF, 542 KB
english, 1993