Evidence of electrochemical resistive switching in the hydrated alumina layers of Cu/CuTCNQ/(native AlOx)/Al junctions
Knorr, Nikolaus, Bamedi, Ameneh, Karipidou, Zoi, Wirtz, René, Sarpasan, Mustafa, Rosselli, Silvia, Nelles, GabrieleVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4823851
File:
PDF, 2.35 MB
english, 2013