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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Experimental results for IDDQ and VLV testing
Chang, J.T.-Y., Chao-Wen Tseng,, Yi-Chin Chu,, Wattal, S., Partell, M., McCluskey, E.J.Year:
1998
Language:
english
DOI:
10.1109/vtest.1998.670858
File:
PDF, 60 KB
english, 1998