[IEEE 2008 International Conference on Simulation of...

  • Main
  • [IEEE 2008 International Conference on...

[IEEE 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) - Hakone-Machi, Kanagawa (2008.09.9-2008.09.11)] 2008 International Conference on Simulation of Semiconductor Processes and Devices - Comparative Simulation Study of GNR-FETs using EHT- and TB-based NEGF

Ming Zhang,, Qiushi Ran,, Ximeng Guan,, Jinyu Zhang,, Yan Wang,, Zhiping Yu,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/SISPAD.2008.4648263
File:
PDF, 917 KB
english, 2008
Conversion to is in progress
Conversion to is failed