[IEEE 2008 IEEE 17th Conference on Electrical Performance of Electronic Packaging (EPEP) - San Jose, CA, USA (2008.10.27-2008.10.29)] 2008 IEEE-EPEP Electrical Performance of Electronic Packaging - Design and analysis of a TB/sec memory system
Beyene, Wendemagegnehu T., Madden, Chris, Kim, Namhoon, Lee, Hae-Chang, Perego, Rich, Secker, Dave, Yuan, Chuck, Vaidyanath, Arun, Chang, KenYear:
2008
Language:
english
DOI:
10.1109/epep.2008.4675866
File:
PDF, 12.53 MB
english, 2008