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[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - An SRAM based testing methodology for yield analysis of semiconductor ICs
Al-Hashimi, Jannah, Tomoq, Seepsa, Abugharbieh, Khaldoon, Al-Qudah, Yazan, Shihadeh, MustafaYear:
2013
Language:
english
DOI:
10.1109/icecs.2013.6815443
File:
PDF, 708 KB
english, 2013