[IEEE 2014 25th Annual SEMI Advanced Semiconductor...

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[IEEE 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2014.5.19-2014.5.21)] 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) - The importance of reporting both composite and maze yield for process split yield learning

Fan Zheng,, Piper, Amanda, Karve, Gauri, Kan Zhang,, Yongchun Xin,, Jang Sim,, Mazzotti, Jason J.
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Year:
2014
Language:
english
DOI:
10.1109/asmc.2014.6846949
File:
PDF, 331 KB
english, 2014
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