SEU fault tolerance in artificial neural networks

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

SEU fault tolerance in artificial neural networks

Velazco, R., Assoum, A., Radi, N.E., Ecoffet, R., Botey, X.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489227
Date:
January, 1995
File:
PDF, 836 KB
english, 1995
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