[IEEE 2008 10th IEEE International Workshop on Advanced Motion Control (AMC) - Trento, Italy (2008.03.26-2008.03.28)] 2008 10th IEEE International Workshop on Advanced Motion Control - Acquisition and visualization of personal characteristics by haptograph
Seiichiro Katsura,, Yuki Yokokura,, Kiyoshi Ohishi,Year:
2008
Language:
english
DOI:
10.1109/amc.2008.4516106
File:
PDF, 741 KB
english, 2008