[IEEE 2013 82nd ARFTG Microwave Measurement Conference - Columbus, OH, USA (2013.11.18-2013.11.21)] 82nd ARFTG Microwave Measurement Conference - Trap model for GaN RF HEMT power switch
Pereira, Aaron, Albahrani, Sayed, Parker, Anthony, Heimlich, Michael, Weste, Neil, Dunleavy, Larry, Skidmore, ScottYear:
2013
Language:
english
DOI:
10.1109/arftg-2.2013.6737339
File:
PDF, 1.23 MB
english, 2013