A new low-parasitic polysilicon SCR ESD protection...

IEEE Electron Device Letters 2005 / 02 Vol. 26; Iss. 2

A new low-parasitic polysilicon SCR ESD protection structure for RF ICs

Haolu Xie,, Haigang Feng,, Rouying Zhan,, Wang, A., Rodriguez, D., Rice, D.
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Volume:
26
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2004.841860
Date:
February, 2005
File:
PDF, 149 KB
english, 2005
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