[IEEE 2010 68th Annual Device Research Conference (DRC) -...

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[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Effects of nanoscale contacts to silicon nanowires on contact resistance: Characterization and Modeling

Smith, Joshua T., Zhao, Yanjie, Yang, Chen, Appenzeller, Joerg
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Year:
2010
Language:
english
DOI:
10.1109/drc.2010.5551876
File:
PDF, 714 KB
english, 2010
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