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[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - Bottom-up digital system-level reliability modeling
Amador, N. Ruiz, Huard, V., Pion, E., Cacho, F., Croain, D., Robert, V., Engels, S., Flatresse, P., Anghel, L.Year:
2011
Language:
english
DOI:
10.1109/cicc.2011.6055343
File:
PDF, 502 KB
english, 2011