A Temperature-Gradient-Induced Failure Mechanism in Metallization Under Fast Thermal Cycling
Smorodin, T., Wilde, J., Alpern, P., Stecher, M.Volume:
8
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2008.2002359
Date:
September, 2008
File:
PDF, 1.44 MB
english, 2008