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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Modeling the impact of process variation on resistive bridge defects
Khursheed, Saqib, Zhong, Shida, Aitken, Robert, Al-Hashimi, Bashir M., Kundu, SandipYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699230
File:
PDF, 293 KB
english, 2010