[IEEE IEEE European Test Workshop, 2001. - Stockholm, Sweden (May 29 - Jun. 1, 2001)] IEEE European Test Workshop, 2001. - A fault model for function and delay testing
Joonhwan Yi,, Hayes, J.P.Year:
2001
Language:
english
DOI:
10.1109/etw.2001.946657
File:
PDF, 900 KB
english, 2001