[IEEE 26th International Spring Seminar on Electronics Technology: Integrated Management of Electronic Materials Production, 2003. - High Tatras, Slovakia (2003.05.11-2003.05.11)] 26th International Spring Seminar on Electronics Technology: Integrated Management of Electronic Materials Production, 2003. - Thermal shock reliability tests of multilayer LTCC modules with thick film conductors
Pietrikova, A., Bansky, J., Bujalobokova, M., Urbancik, J.Year:
2003
Language:
english
DOI:
10.1109/isse.2003.1260578
File:
PDF, 280 KB
english, 2003