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[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - ESD failure mechanisms of inductive and magnetoresistive recording heads
Wallash, A.J., Hughbanks, T.S., Voldman, S.H.Year:
1995
Language:
english
DOI:
10.1109/eosesd.1995.478300
File:
PDF, 1.34 MB
english, 1995