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[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies
Ousten, Y., Mejdi, S., Fenech, A., Deletage, J.Y., Bechou, L., Perichaud, M.G., Danto, Y.Year:
1997
Language:
english
DOI:
10.1109/ipfa.1997.638124
File:
PDF, 805 KB
english, 1997