[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Understanding amorphous states of phase-change memory using Frenkel-Poole model
Shih, Y.H., Lee, M.H., Breitwisch, M., Cheek, R., Wu, J.Y., Rajendran, B., Zhu, Y., Lai, E.K., Chen, C.F., Cheng, H.Y., Schrott, A., Joseph, E., Dasaka, R., Raoux, S., Lung, H.L., Lam, C.Year:
2009
Language:
english
DOI:
10.1109/iedm.2009.5424229
File:
PDF, 921 KB
english, 2009